| SERVICE | PRODUCT | DETERMINANT | TECHNIQUE | PROCEDURE | LIMITATION / RANGE |
DC and low frequency electrical metrology - Electrical measurement and test equipment
| Phase angle meters;
| Frequency;
| Comparison with a reference standard;
| | 10 Hz ≤f ≤ 500 kHz
0 s to 105 s |
|
CAPABILITY
0.02º for 10 Hz ≤f ≤ 100 Hz
0.03º for 100 Hz <f ≤ 1 kHz
0.05º for 1 kHz <f ≤ 5 kHz
0.07º for 5 kHz <f ≤ 10 kHz
0.15º for 10 kHz <f ≤ 500 kHz
The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s |
Speed and velocity - Speed measuring devices
| Time interval equipment;
| Distance; Speed; Time interval;
| By time and length measurement;
| Time-interval based speed and distance measuring instruments, including calibrators for laser-based (LIDAR) speed and distance measuring instruments
| 20 km/h to 300 km/h
10 m to 2 km
0 s to 105 s |
|
CAPABILITY
0.005 km/h in the range 20 km/h to 300 km/h
0.02 m in the range 10 m to 2 km
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s
(The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines) |
| Laser equipment including LIDAR;
| Distance; Speed;
| Direct measurement against a reference standard;
| | 20 km/h to 300 km/h
10 m to 2 km
0 s to 105 s |
|
CAPABILITY
Calibrators for laser-based (LIDAR) speed and distance measuring instruments
With least uncertainties of measurement of :
0.2 km/h in the range 20 km/h to 300 km/h, and
0.02 m in the range 10 m to 2 km
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s
(The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines) |
Time and frequency metrology - Frequency and time standards
| Caesium standard; Frequency standards; Rubidium standard;
| Coordinate universal time (UTC); Frequency; Time interval;
| Measurement against reference standard;
| | 1 mHz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
0 s to 105 s |
|
CAPABILITY
The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines
Frequency with least uncertainties of measurement of -
2 in 1013 from 1 mHz to 40 GHz
(a minimum slew rate of 1V/μs is assumed at frequencies below 100 kHz
10 kHz from 182 THz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s
Measurement capability includes both laboratory based calibrations
and those performed via remote monitoring
Capability includes both laboratory based calibrations
and those performed via remote monitoring.
with least uncertainties of measurement of -
50 ns |
| Signal sources;
| Frequency;
| Measurement against reference standard;
| | Frequency characteristics
1 mHz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
0 s to 105 s |
|
CAPABILITY
Frequency characteristics
Frequency with least uncertainties of measurement of -
2 in 1013 from 1 mHz to 40 GHz
(a minimum slew rate of 1V/μs is assumed at frequencies below 100 kHz
10 kHz from 182 THz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
(The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines) |
| Laser length standards (interferometers);
| Frequency;
| Measurement against reference standard;
| Measurement of optical frequency / wavelength of stabilised lasers used in length interferometry in accordance with Test Method PM-TFR-T08
| 1 mHz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
0 s to 105 s |
|
CAPABILITY
2 in 1013 from 1 mHz to 40 GHz
(a minimum slew rate of 1V/μs is assumed at frequencies below 100 kHz
10 kHz from 182 THz to 565 THz
(vacuum wavelength 1650 nm to 530 nm) |
Time and frequency metrology - Frequency, time and waveform measuring equipment
| Clocks and timers; Counters; Frequency meters; Time interval meters;
| Frequency; Time interval;
| Measurement against reference standard;
| | 1 mHz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
0 s to 105 s |
|
CAPABILITY
The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines
Frequency with least uncertainties of measurement of -
2 in 1013 from 1 mHz to 40 GHz
(a minimum slew rate of 1V/μs is assumed at frequencies below 100 kHz
10 kHz from 182 THz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s
Measurement capability includes both laboratory based calibrations
and those performed via remote monitoring
|
| Frequency analysers; Frequency meters; Time interval meters;
| Frequency; Time interval;
| Measurement against reference standard;
| | 1 mHz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
0 s to 105 s |
|
CAPABILITY
The uncertainty of measurement does not consider the DUT
and follows the CCTF guidelines
Frequency characteristics
Frequency with least uncertainties of measurement of -
2 in 1013 from 1 mHz to 40 GHz
(a minimum slew rate of 1V/μs is assumed at frequencies below 100 kHz
10 kHz from 182 THz to 565 THz
(vacuum wavelength 1650 nm to 530 nm)
Time characteristics
Time Interval with least uncertainties of measurement of -
√[(200 ps)2 + ((1.3x10-11s½)√T)2], from 0 s to 105 s |
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